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Other articles related with "multiple cell upset (MCU)"：
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38501 |
Xiaoyu Pan(潘霄宇), Hongxia Guo(郭红霞), Yinhong Luo(罗尹虹), Fengqi Zhang(张凤祁), Lili Ding(丁李利) |
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Analysis of multiple cell upset sensitivity in bulk CMOS SRAM after neutron irradiation |
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Chin. Phys. B
2018 Vol.27 (3): 38501-038501
[Abstract]
(624)
[HTML 0 KB]
[PDF 2130 KB]
(320)
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